
TEMPERATURE CYCLE (Tables 4A ..4J)
TABLE 4A: MOSFET/IGBT single device
Date Code Low
High
Number
# Part Number or Temp.
Temp.
of
Sample
Failures
Device Cycles
Remark
Test # [°C]
[°C]
Cycles
Size
1 FII50-12EL 1534 -55
2 IXBH9N160G 1574 -55
3 IXDD404SI 1913 -55
4 IXDD404SIA 1695 -55
5 IXDN75N120 1606 -40
6 IXKC13N80C 1769 -55
7 IXKC25N80C 1590 -55
8 IXKH20N60C5 2013 -40
9 IXKH70N60C5 1926 -40
10 IXKP10N60C5M 1693 -40
11 IXKP13N60C5M 1716 -55
12 IXKT70N60C5 2068 -55
13 IXUC200N055 1802 -55
150
150
150
150
150
150
150
150
150
150
150
150
150
100
50
1000
500
20
100
100
50
50
100
100
1000
90
20
20
83
30
10
20
20
20
20
20
20
20
50
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
1000
83000
15000
200
2000
2000
1000
1000
2000
2000
20000
4500
TABLE 4B: MOSFET/IGBT Module
Date Code
Low
High
Number
# Part Number or
Temp.
Temp.
of
Sample
Failures
Device Cycles
Remark
Test #
[°C]
[°C]
Cycles
Size
1 MDI300-12A4 1555
2 MIAA20WD600TMH 1844
3 MII400-12E4 1741
4 MII75-12A3 1541
5 MIXA15WB1200TED 1992
6 MKI75-06A7T 1562
7 MKI75-06A7T 1724
8 MKI75-06A7T 1724
9 MKI80-06T6K 1818
10 MUBW15-12A7 1466
11 MUBW25-12T7 1896
12 MUBW75-12T8 1731
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
150
150
150
150
150
150
150
150
150
150
150
150
50
100
50
50
100
50
50
50
100
50
100
100
10
9
10
10
10
10
10
10
10
10
10
10
0
0
0
0
0
0
0
0
0
0
0
0
500
900
500
500
1000
500
500
500
1000
500
1000
1000
IXYS Semiconductor GmbH
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